MTS Nano-Indenter

Measures the hardness and Young’s modulus of nanometer-scale thin film materials.

Software calibration is used to minimize substrate effects.

The Nano Indenter XP is equipped with a proprietary Continuous Stiffness Measurement (CSM) system, enabling precise measurement of hardness and elastic modulus.

Features a high-resolution positioning stage and programmable path-setting functions, allowing for accurate measurement of thin films deposited on substrates.

Designed for indentation, hardness, scratch, and general nanoscale testing of thin films, coatings, and materials.