MTS Nano-Indenter
English (英文)
儀器廠牌 Equipment Brand
Scientech
購置日期 Purchase Date
2021.07
放置位置 Location
人科二館 DS114
所屬實驗室 Associated Lab
功能說明 Function Description
Measures the hardness and Young’s modulus of nanometer-scale thin film materials.
Software calibration is used to minimize substrate effects.
The Nano Indenter XP is equipped with a proprietary Continuous Stiffness Measurement (CSM) system, enabling precise measurement of hardness and elastic modulus.
Features a high-resolution positioning stage and programmable path-setting functions, allowing for accurate measurement of thin films deposited on substrates.
Designed for indentation, hardness, scratch, and general nanoscale testing of thin films, coatings, and materials.