Nanoindentation Instrument

English (英文)
儀器廠牌
Scientech
購買日期
2021.07
放置位置
人科二館 DS114
功能說明
Measures the hardness and Young’s modulus of nanometer-scale thin film materials.
Software calibration is used to minimize substrate effects.
The Nano Indenter XP is equipped with a proprietary Continuous Stiffness Measurement (CSM) system, enabling precise measurement of hardness and elastic modulus.
Features a high-resolution positioning stage and programmable path-setting functions, allowing for accurate measurement of thin films deposited on substrates.
Designed for indentation, hardness, scratch, and general nanoscale testing of thin films, coatings, and materials.